Figure 3

TEM images of the α-Si₃N₄ nanobelts.

(a) A typical low-magnification TEM image of α-Si₃N₄ nanobelts. (b) An individual α-Si₃N₄ nanobelt, (c) corresponding EDX spectrum and (d) SAED pattern of the nanobelt. (e and f) High-resolution TEM images with the α-Si₃N₄ nanobelt shown in Fig. 3b. (g) TEM and (h) HRTEM of an α-Si₃N₄ nanobelt with stacking faults.