Figure 2
From: Super sub-wavelength patterns in photon coincidence detection
Schematic for the second-order correlation measurement of a double-slit with charge-coupled devices (CCDs).
The rotating ground glass disk (GGD) and the double-slit are placed as close together as possible. The two CCDs are placed in the Fraunhofer diffraction region with respect to the double-slit. The CCD is a 1, 040 × 1, 392 array of 4.65 × 4.65 µm2 pixels and the measurement is made with an exposure time of 0.2 ms.
