Figure 2 | Scientific Reports

Figure 2

From: Multiple π-bands and Bernal stacking of multilayer graphene on C-face SiC, revealed by nano-Angle Resolved Photoemission

Figure 2

(a) A macro-LEED pattern collected at 79 eV, showing that the dominant orientation of the graphene grains is rotated 30° relative to the SiC substrate while the two sets of weaker and more elongated diffraction spots are rotated about ±10° relative to the SiC substrate. The inner six spots represent the (1 × 1) diffraction pattern of the SiC substrate. (b) Fermi surface (Ei = 0 eV) constructed from the second set of micro-ARPES data, collected at azimuthal angles from 0° to 90° and displayed rotated in such a way that the directions of the dominant and minor features in (a) and (b) coincide.

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