Figure 5
From: Reassignment of Scattered Emission Photons in Multifocal Multiphoton Microscopy
(a) Intensity comparison of the simulated beads MMM image (blue, main anode + ghosts, subjected to Poisson noise) and their processed images (red) showing photon conservation after the process. (b–d) Scattering matrix elements distribution at 2 by 2 MMM anodes. (b) Original distribution used in simulation, (c) estimated distribution of the processed bead image and (d) the alphabet image. One sub-image contains primary element of scattering matrix from the corresponding anode of image and three scattering matrix elements showing the leakage of emission photons to the neighbor anodes due to scattering.
