Figure 7

(a) Schematic diagram of single CuSe nanosheet-based electrical circuit for C-AFM measurement. (b) Topography and (c, d) current images of CuSe nanosheet are obtained simultaneously under the C-AFM mode. The applied bias voltage is (c) 100 mV and (d) −100 mV. (e, f) Spatial profiles of the current along corresponding lines in the C-AFM images (c, d).