Figure 1
LCLS XCS experimental setup and measured speckle pattern.
(a). XCS instrument experimental setup at LCLS. Successive speckle patterns are recorded with a delay Δt between each frame. (b). TEM image of the gold nanoparticles (5.5 nm dia. nanospheres) grafted polystyrene sample (Mw = 42 kg/mol polystyrene matrix). (c). Speckle pattern produced by the fully transverse coherent X-ray beam incident on the sample in (b) in transmission geometry. This pattern was measured at SDD of 5037 mm and at 393 K. The color bar on the right indicates the intensity in the 2D detector converted into photons. The dark blue feature on the left lower part of the image is the beam stop used to mask the direct beam.
