Figure 1
From: Physical Justification for Negative Remanent Magnetization in Homogeneous Nanoparticles

Structural characterization of 15 nm EuS NPs.
(a) HR-TEM micrograph of 15 nm EuS NPs (Insets: histogram of size distribution as fitted into function y = −0.37x2 + 11.78x − 46.41 and an electron diffraction pattern of face-centered-cubic (fcc) EuS NPs, exhibiting features from arising from (220) and (200) lattice planes). (b) A high-magnification TEM image of a single EuS NP (Inset: electron diffraction pattern as obtained via Fourier analysis)22.