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Figure 1

From: Physical Justification for Negative Remanent Magnetization in Homogeneous Nanoparticles

Figure 1

Structural characterization of 15 nm EuS NPs.

(a) HR-TEM micrograph of 15 nm EuS NPs (Insets: histogram of size distribution as fitted into function y = −0.37x2 + 11.78x − 46.41 and an electron diffraction pattern of face-centered-cubic (fcc) EuS NPs, exhibiting features from arising from (220) and (200) lattice planes). (b) A high-magnification TEM image of a single EuS NP (Inset: electron diffraction pattern as obtained via Fourier analysis)22.

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