Figure 5 | Scientific Reports

Figure 5

From: Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiO

Figure 5

FORC ESM ionic transport maps.

FORC ESM spatial maps of NiO film with dislocations and a square defect. (a) Topographic image of the measured region. Spatial maps of the ESM parameters: (b) ESM loop area (Arrows show the points with large response in the square defect), (c) maximum difference of the surface displacement, (e) imprint and (f) nucleation bias. (d) ESM hysteresis loops extracted at the points shown by dots in a. Each loop is averaged for six points.

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