Figure 3
From: Virus detection and quantification using electrical parameters
Quantification and characterization of silica nanoparticles, HIV and FIV particles: (a) Schematic representation of the semiconducting junction. “Holes” refer to the “vacant” position occupied by the moving electrons in the semiconducting material. W, width of the “depleted region”. (b) Relative percentage of the particle distribution over diameter using the UVIS technique. (c) Current-voltage and (d) Capacitance-voltage measurements of silica nanoparticles using the electrical technique. (e) Comparison of concentrations obtained with the electrical method compared to other conventionally-used techniques relevant to the material tested. The concentration of the viral particles (VP) per milliliter (ml) was found to be as follows: HIV = 2.0–3.2 × 1010 VP/ml, FIV = 3.6–6.2 × 1010 VP/ml. The silica nanoparticle concentration was measured to be 2.4–5.4 × 1011 per ml. (f) The classifier parameter (signature value) for the different materials used.
