Figure 1 | Scientific Reports

Figure 1

From: A new non-destructive readout by using photo-recovered surface potential contrast

Figure 1

Samples preparation and characterization.

(a) HAADF-STEM image of a BFO/SRO/STO heterostructure. The thicknesses of BFO and SRO layers are 18 and 35 nm, respectively. (b) Cross-sectional HAADF-STEM image for the BFO/SRO interface. (c) Local PFM hysteresis loops measured in the 18-nm-thick BFO film. (d) Out-of-plane PFM phase image on the stripes written by the PFM tip with +8 V and −8 V bias alternatively. (e) and (f) KPFM image at the same area obtained immediately and 14 hour after poling, respectively.

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