Figure 2
From: Real-time and Sub-wavelength Ultrafast Coherent Diffraction Imaging in the Extreme Ultraviolet
XUV diffraction pattern and reconstruction at 0.8λ resolution for 150 s exposure time: (a), STEM image of the sample consisting of a 200 nm gold layer on a 200 nm thick silicon nitride membrane. (b), Measured raw diffraction pattern for an exposure time of 150 s and 33.2 nm wavelength. The pixels which are overexposed or obscured by the beamstop are set to zero. (c), The reconstructed object space shows the non-periodic complex-shaped object. In this panel the phase and amplitude of the complex-valued object space is encoded in the hue and brightness, respectively. Only the sub-wavelength features (sparks on the right lower part in a and details in “Jena”) are missing as explained in the text (d), The analysis of the PRTF suggests a resolution of 26 nm corresponding to 0.8λ. The scale bars in a and c are one micron.
