Figure 3
From: Real-time and Sub-wavelength Ultrafast Coherent Diffraction Imaging in the Extreme Ultraviolet
Real-time XUV imaging at sub-70 nm spatial resolution: (a), Measured raw diffraction pattern using 1 s exposure time and 33.2 nm wavelength. The beamstop was removed for this measurement. The photon flux was sufficient to take full advantage of the dynamic range of the CCD. (b), Reconstructed object space (complex-value representation as in Fig. 2c) showing the main features of the nanostructured aperture. The scale bar is one micron. (c) The achieved spatial resolution according to the PRTF is Δr = 65 nm, which corresponds to roughly two wavelengths of the illuminating light.
