Figure 5
From: Octahedral faceted Si nanoparticles as optical traps with enormous yield amplification
PL spectra (a and c) and PL enhancements (b and d) in GaAs (a and b) and Kapton® (c and d).
On the left: PL spectra collected on (a) GaAs and (c) Kapton® layers covered by Si-NPs compared to the reference PL spectrum in a reference bulk sample of each material. On the right: the normalised yield as a function of the increasing volume of Si constituting the nanoparticles per sample unit area. The measurements on Kapton® layers were performed in transmittance to avoid any contribution from the holder to this semi-transparent substrate. The increased yield in the samples covered by Si-NPs is evident in both materials, but the extent of the amplification is much higher in a Kapton® layer—up to a factor of 10—than in the GaAs layer. The solid line is an exponential fit to the data. The fitting curves have the same decay constant and differ only in amplitude, as discussed in the text.
