Figure 1

F₁₆CuPc molecular structure (a) and film morphology (b–f) grown on SiO₂ with different film thicknesses: (b) 30 nm, (c) 70 nm, (d) 70 nm, (e) 120 nm, (f) 260 nm.

(b–c) are AFM images and (d–f) are SEM images. The circles indicate the growth of nanobelt crystals on the caterpillar-like crystal layer.