Figure 2 | Scientific Reports

Figure 2

From: Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement

Figure 2

Configuration of the proposed TOF measurement.

(a) Comparison between emission spectra of 355 and 532 nm from Nd:YAG laser and extinction coefficients of organic materials used in the current study. The extinction coefficient of NPB was magnified twofold. Optical properties of OPV device with 6% PCE is provided. (b) Energy-level diagram and molecular structures of organic materials. (c) Device structures of TOF samples without (w/o) and with (w/) a CGL (SubPc:C70) for laser illumination at 355 and 532 nm, respectively. (d) Schematic diagram of the TOF measurement with employment of the CGL. The solid and open circles denote electron and hole, respectively. All the structures are not scaled with a real device.

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