Figure 6 | Scientific Reports

Figure 6

From: Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement

Figure 6

Comparison of CGLs deposited underneath and atop the NPB.

Hole and electron mobility obtained from the various device structures with depositing CGLs underneath and atop NPB layer. The open circles and dashed lines indicate the hole mobility of the NPB. The solid circles and lines indicate the electron mobility of the NPB. The inset depicts CGL/NPB and NPB/CGL structures. In the inset, the open and solid symbol denote the hole and electron, respectively.

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