Figure 6 | Scientific Reports

Figure 6

From: Absence of Structural Impact of Noble Nanoparticles on P3HT:PCBM Blends for Plasmon-Enhanced Bulk-Heterojunction Organic Solar Cells Probed by Synchrotron GI-XRD

Figure 6

Line profiles collected at critical angle, extracted with cake slices centred at χ = 15° (Δχ = 10° integration aperture), for films deposited from P3HT: PCBM: Ag NPs solutions (7–12), measured ex-situ before and after annealing. All line profiles are normalized with respect to the line profile region between the end of the beamstop and the beginning of the first peak, (100)-P3HT peak. The line profile drop near q = 1.5 Å-1 for the annealed 1mL in (b) is due to background issues.

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