Figure 1
From: Mechanical writing of n-type conductive layers on the SrTiO3 surface in nanoscale
Conductive surface layer fabrication and verification.
(a) AFM writing and conductivity measurement configuration. (b) Schematic illustration for the writing and measurement areas. (c) Tip current under 5 V bias (at the center of the black rectangle 1 in Fig. 1b) versus scanning times. (d) Topography of the STO surface after scratching (red square 2 in Fig. 1b). (e) Current distribution image over the area of the red square 2 in Fig. 1b. The bright stripe corresponds to the scratched conductive layer connecting the electrode. (f) Current distribution image over the area of blue square 4 in Fig. 1b. No current is detected over the scratched area (green square 3 in Fig. 1b) isolated from the electrode.
