Figure 1
From: Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films
Comparison for the XRD θ-2θ scans for BTO:Sm2O3 thin films with compositions of (a) x = 0.5 and (b) x = 0.62.
Figure 1 | Scientific Reports
