Figure 2
From: Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films
High-resolution TEM images of BTO:Sm2O3 thin films with (a) x = 0.5 and (c) x = 0.62. Corresponding Fourier-filtered (FFT) images along column boundaries are shown as (b) and (d), respectively. The FFT images are enlarged to show misfit dislocations clearly.
