Figure 4
From: Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films
Frequency dependence of tanδ for BTO:Sm2O3 thin films with (a) x = 0.5 and (b) x = 0.62 measured at different temperatures. The insets show the Arrhenius plots of relaxation times. The red straight lines in insets are the linear fitting based on the Arrhenius law.
