Figure 5
From: Vertical Interface Induced Dielectric Relaxation in Nanocomposite (BaTiO3)1-x:(Sm2O3)x Thin Films
Variation of 
as a function of temperature for BTO:Sm2O3 thin films with (a) x = 0.5 and (c) x = 0.62 measured at different frequencies. The corresponding Arrhenius plots of the frequency against temperature were shown in (b) and (d), respectively. The solid curves are the best fits to the Arrhenius law.
