Figure 2
XRD measurements on the CBST film capped by Te.
(a) XRD pattern along the surface normal direction. All peak positions except three peaks marked with diamond satisfy the space group of CBST or STO and the additional three peak positions are consistent with the (n 0 -n 0) reflection of bulk Te crystal with a lattice constant a = 4.47 ± 0.03 Å. (b,c) Reciprocal space maps in the K-L plane with H = 0. Sharp spots are present only at positions consistent with STO, CBST or Te lattice indicating that Te as well as CBST is grown epitaxially. (d) Azimuthal scans of STO {2 2 1} and CBST {0 1 –1 20} reflections in which the azimuthal angle is defined with respect to the [1 1 –2] and [0 1 –1 0] directions on the surface of STO and CBST, respectively. The capped and uncapped films satisfy the same epitaxial relationship. (e) θ-Φ map around the (0 1 –1 20) reflection of CBST. The spots separated by 1° in θ from the CBST (0 1 –1 20) reflections correspond to Te (2 1 –3 1) reflection from which the epitaxial relationship of Te [0 1 –1 1] || CBST [2 1 –3 0] has been obtained. (f) The crystal structures of STO, CBST and Te projected to the planes normal to the stacking direction. The different colored spheres represent atoms regardless of kinds of atoms in different planes; small spheres at left are oxygen atoms. The d-spacing and angle of Te lattice presented were calculated with the lattice constants of bulk Te, which may be slightly different from those of the Te film due to strain.
