Figure 4 | Scientific Reports

Figure 4

From: Crystallinity of tellurium capping and epitaxy of ferromagnetic topological insulator films on SrTiO3

Figure 4

Room temperature angle resolved photoemission spectroscopy (ARPES) data of (Bi,Sb)2Te3 film with varying tellurium capping thickness.

k|| refers to the Κ-Γ-Κ direction in the reciprocal space of (Bi,Sb)2Te3 film. (a) uncapped 5 QL (Bi,Sb)2Te3 film, (b) 5 QL (Bi,Sb)2Te3 film with 0.625 nm Te capping layer, (c) 5 QL (Bi,Sb)2Te3 film with 1.25 nm Te capping layer, (d) 5 QL (Bi,Sb)2Te3 film with 1.875 nm Te capping layer.

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