Figure 3 | Scientific Reports

Figure 3

From: Quick Fabrication of Large-area Organic Semiconductor Single Crystal Arrays with a Rapid Annealing Self-Solution-Shearing Method

Figure 3

Characterization of the BPEA arrays by different ways.

(a) XRD patterns of the single crystals generated at the same condition on the different substrates. All patterns have two main peaks at the same location (2θ = 7.8°, 15.7°), which are indexed to α phase of BPEA. (b) SAED pattern of a ribbon; the pattern exhibits a single set of parallel spots, indicating the single crystallinity of the ribbons. (c) AFM height mode image of the single crystal arrays and the corresponding cross sectional profile, showing the ribbon surface is very smooth (roughness about 0.3 nm) and the ribbon array is uniform with its ribbon width about 1.56 μm and the height about 45 nm.

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