Figure 1
Schematic of the measurement setup used to collect the X-ray diffraction (XRD) data under electric field.
The sample is rotated toward the incident beam in order to minimize the angle η between the electric field Eand the scattering vector Q, for the Q||E sector of the detector. The angular sectors of ±10° used to extract the XRD traces parallel and perpendicular to the field are indicated using white lines. The sample stage is shown in the inset.
