Figure 3 | Scientific Reports

Figure 3

From: Reliable and cost effective design of intermetallic Ni2Si nanowires and direct characterization of its mechanical properties

Figure 3

Schematic pictures of the tensile tests on a Ni2Si nanowire with a push-to-pull (PTP) device.

The PTP device and a diamond tip were attached to the force transducer as shown in (a) and in (b) the enlarged image of the PTP device and a tip contact point (CP) and a tensile region (TR, marked by a rectangle) were represented. A Ni2Si nanowire sample mounted to the ends of the TR by Pt deposits (marked by circles) was shown in (c). The captured TEM photographs of the Ni2Si nanowire were provided for three major moments of the tensile test: before in (d) during in (e) and after mechanical fracture at (f).

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