Figure 2
From: Optical fiber tip templating using direct focused ion beam milling
(a) Scanning ion microscopy image of a square lattice of holes milled on the optical fiber tip used for recipe optimization; (b) AFM profile of (a); (c) AFM top view image of holes after nSiOx overlay deposition, zoomed in for better view; (d) AFM profile of the scan line indicated in (c).
