Figure 3
From: Optical fiber tip templating using direct focused ion beam milling
(a) Experimental reflection spectra obtained with patterned areas of 14.4 × 14.4 μm2 (red dotted line) and 28.8 × 28.8 μm2 (black solid line). The SEM images (top view) of the characterized probes with small and large patterned areas are plotted in (b,c) respectively.
