Figure 6
From: Optical fiber tip templating using direct focused ion beam milling
(a) Comparison between experimental (solid blue line) and numerical (solid red line) reflection spectra pertaining to device schematized in the inset, achieved with the following parameters a = 900 nm, r/a = 0.35, t = 300, d = 200 nm, θbot = 5°, θtop = 50°. The gold overlay has a thickness of 25 nm. (b) Comparison between numerical reflection spectra with (solid red line) and without (blue dotted line) the gold overlay. Electric field intensity maps evaluated at reflectance dips wavelengths (1510 (c) and 1548 nm (d)).
