Figure 6

(a) TRPL spectra of the same samples measured in Fig. 4.8. (b) IQE of InGaN NW samples, as measured from the Arrhenius plots of the temperature-dependent variations in the integrated PL intensity. Temperature-dependent PL for (c) UIF reference sample grown at 710 °C, (d) EIF sample grown at 710 °C, (e) EIF sample grown at 720 °C and (f) EIF sample grown at 730 °C.