Table 1 The measured parameters from TRPL and temperature-dependent PL for the UIF reference sample and EIF samples.

From: Vertically aligned InGaN nanowires with engineered axial In composition for highly efficient visible light emission

Sample

τ (ns)

IQE (%)

τr (ns)

τnr (ns)

UIF @ 710 °C

0.121

7.3

1.7

0.130

EIF @ 710 °C

0.111

10

1.1

0.123

EIF @ 720 °C

0.072

13

0.56

0.083

EIF @ 730 °C

0.066

23

0.29

0.085

  1. The TRPL data were measured at room temperature.
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