Figure 2
From: 3D visualization of XFEL beam focusing properties using LiF crystal X-ray detector
Measurements of intensity distribution of the XFEL beam near the focus position.
(a) Central diagonal-sequence of PL images, obtained in 10 XFEL shots on the surface of LiF detector in different planes; upper diagonal-schematic interpretation of the PL images; below diagonal-3D plots of the PL intensity for corresponding images. To avoid saturation, two images near the focus, marked by the red line, were readout with 5 times less accumulation time compared to all others. (b) Schematical principals of the LiF crystal detector application for hard X-ray imaging. In the first step (I) the X-ray radiation of the XFEL beam irradiated the LiF crystal and produced color centers (CCs)24, which formed a hidden image according to the intensity distribution of the XFEL beam. In the second step (II) the stored image is visualized by means of CCs photoluminescence. The confocal fluorescent microscope Nikon C2+ was used for the readout process. Objective with magnification of 40× was used, which allowed to digitize images with spatial resolution up to 0.3 μm.
