Figure 4
From: 3D visualization of XFEL beam focusing properties using LiF crystal X-ray detector
Observation of the focused XFEL beam propagation through the waist inside the LiF crystal.
(a) Sketch of the measurements showing the range of depth where measurements have been done. Step of scan δZ was of 40 μm. The XFEL beam with photon energy of E = 10.1 keV was focused by KB mirrors on the LiF crystal at the best focusing position of Z = 12.5 mm, which were determined by a long distance preliminary scan (See Fig. 2a). (b) PL images, measured at different distances from the surface of the LiF crystal with magnification of 40× (bottom row) and the corresponding intensity distribution plots (upper row). Presented images give information about the 3D intensity distribution of the XFEL beam propagating inside the LiF crystal.
