Figure 5
From: 3D visualization of XFEL beam focusing properties using LiF crystal X-ray detector
Sketch of the electron cascades in LiF caused by interaction of XFEL photons with fluorine ions.
The limit of resolution defined by the resolution of the microscope system (~0.9 μm in our case) and the secondary processes (mainly photoionization) caused by interaction of 10 keV photons with LiF according to modeling provided in ref. 42, the size of the secondary electrons cloud should be within a diameter of ~1.2 μm, which is in a good agreement with the experimentally measured value of smallest focusing spot.
