Figure 2
(a) TXM-micrograph of the Cu2O spheres after synthesis: overlay of 930.8 eV (yellow) and 933.8 eV (blue) represents the chemical inhomogeneity of the sample. (b) TXM-micrograph of the Cu2O octahedron after synthesis (933.8 eV). (c) TXM-micrograph of the CuO spheres after oxidation (532.7 eV). (d) TXM-micrograph of the CuO octahedron after oxidation (532.7 eV). (e) NEXAFS spectra at the Cu-L2,3-edge of the Cu2O nanoparticles after synthesis. (f) NEXAFS spectra at the O-K-edge and Cu-L2,3-edge of the CuO nanoparticles after oxidation. In the XRD pattern, the measured intensity is plotted versus the scattering angle 2Θ. (g) XRD pattern of Cu2O nanoparticles after synthesis. (h) XRD pattern of CuO nanoparticles after oxidation. The reference values for the expected Bragg peaks for Cu2O and CuO are depicted via the δ–function at the corresponding angles.
