Figure 2
From: Low temperature solution process-based defect-induced orange-red light emitting diode
Surface morphology, structural and optical characteristics of CuO NRs.
The SEM images of CuO NRs after (a) PDMS transfer on a bare and unpatterned substrate and after (b) PDMS transferring, rubbing and pressing in a 5 μm pattern. The inset of (a) is the corresponding magnified view of the image indicating an average length and breadth of 400 nm and 50 nm of the NR, respectively. The inset of (b) shows the full view of a pattern with uniform, compact and smooth CuO layer after rubbing and pressing; (c) XRD pattern of CuO NRs, predominantly in the direction of (111); (d) The UV-Vis absorption spectra of CuO NRs, of which the Tauc plot is also shown in the inset indicating an optical bandgap of 1.4 eV.
