Figure 2
Improved structural properties of InN monocrystals as compared with planar layers.
(a) A plane-view SEM image showing smoother top surface of the crystals than the surface of surrounding planar areas. (b) Evolution of the crystal size and composition during growth. The points of EDX microanalysis are marked by ‘x’; the In content is given nearby. (c) The EDX profiles of In content done: 1—along a line L in (a); 2—across the area enriched with metallic indium in a reference planar layer. The large crystal cavities are characterized by some lack of In. (d) First-order μ-R spectra taken from: 1—the crystal, 2—the planar layer. The crystals exhibit the narrower widths of allowed E2 and A1(LO) Raman modes and the shift of a mixed plasmon-LO-phonon mode PLP* towards lower frequencies.
