Figure 1
From: Remarkably stable amorphous metal oxide grown on Zr-Cu-Be metallic glass
Cross-sectional bright field TEM images obtained from (a) the Zr50Cu50 and (b) the Zr46Cu46Be8 alloys showing the oxide films after continuous heating up to 623 K and 673 K, respectively; and the magnified HR TEM images of the oxide film and the FFT diffraction patterns (Fig. 1(c,d)) obtained from the region marked by the dashed line in Fig. 1(a,b).
