Figure 3
From: Spatial potential ripples of azimuthal surface modes in topological insulator Bi2Te3 nanowires
Accurate determination of electrical conductivity via surface potential mapping.
(a,b) show SEM and AFM topographic images of a 45 nm diameter nanowire. (c,d) show the KPM 2D-surface potential map of the nanowire while applying a bias of 0.35 V and −0.35 V to the left electrode, respectively. (e,f) shows the surface potential profile along the nanowire for the two different bias applied. The dashed vertical blue lines mark the region of voltage drop along the nanowire used in the analysis. From the slope of the potential drop and the current flowing through the wire, the electrical resistance can be determined. (g) Shows the I–V curve obtained from two-probe measurements.
