Figure 2

A schematic of the testing configuration is shown in (a) where a nanowire is gripped between the load cell and a TEM half grid with Pt-based EBID. An electrical current can then be passed from the load cell to the half grid. An example raw data set is shown in (b), which includes strain measured from the image sequence and force over time. Regions of different power dissipation are also indicated. To emphasize the large strains achieved through thermoplastic deformation the first and final frame of the testing sequence are shown in (c) with the original length indicated by the dashed lines.