Figure 3
From: Raman fingerprint for semi-metal WTe2 evolving from bulk to monolayer
Microscopic Imaging.
(a) Optical microscopic images of mono- to multilayer WTe2 on a Si substrate with a 300 nm SiO2 layer. (b) AFM image of the area (20 × 20 μm2) surrounded by a green dashed line in (a). (c) Height of the flake as a function of the layer number.
