Table 1 Summary of averaged lattice constant, tetragonal ratio, measured (Exp.) and calculated (Cal.) Curie temperature Tc of PSMO films with different thicknesses.

From: Effects of strain relaxation in Pr0.67Sr0.33MnO3 films probed by polarization dependent X-ray absorption near edge structure

Thickness (nm)

a (Ã…)

c (Ã…)

c/a

MnO 6 Tilt

T c /T c, 30 nm

Exp.

Cal.

12

3.790

3.957

1.044

a 0 a 0 c −

—

—

30

3.790

3.959

1.045

a 0 a 0 c −

1

1

50

3.790

3.958

1.044

a − a − c −

1.013

1.006

80

3.792 (L)

3.956 (L)

1.043 (L)

a − a − c −

1.221

1.040

3.796 (R)

3.947(R)

1.040 (R)

   

100

3.792 (L)

3.954(L)

1.043 (L)

a − a − c −

1.275

1.102

3.807 (R)

3.924(R)

1.031 (R)

   
  1. Tc was normalized to that of the 30-nm film. For the lattice constants of the 80-nm and 100-nm films, the in-plane lattice constant was calculated based on volume-conservation. Refer to the text for more details.