Figure 2
From: Single-crystalline aluminum film for ultraviolet plasmonic nanolasers
(a) Low-incident-angle 2θ scan of the polycrystalline Al film. (b) XRD setup for the φ-dependent measurement of the Al(111) plane (c) Results of the φ-dependent scan of the polycrystalline Al film. (d) Results of the φ-dependent scan of the single-crystalline Al film.
