Figure 3
From: Real Time Imaging of Deuterium in a Duplex Stainless Steel Microstructure by Time-of-Flight SIMS
Principle component score and secondary electron images of the ToF-SIMS data sets acquired after 37 days of charging.
(a) PC1 scores image obtained from the positive SIMS data set acquired after 37 days of charging DSS and used to identify phases in the DSS micro structure. A fresh region of interest (ROI) has been selected. The bright regions represent the austenite phase (as shown in the loading plot in Figure S2a). (b) PC1 scores image related to locations rich in deuterium. The image was generated by PCA of a negative ToF-SIMS image data set obtained after loading with deuterium for 37 days. The bright deuterium-rich areas have positive scores and correspond to the ferrite phase while the dark areas have negative scores and relate to austenite grains. (c) Ion induced secondary electron (SE) image of displaying grains in the DSS microstructure at the selected region of interest.
