Figure 1
From: Voltage divider effect for the improvement of variability and endurance of TaOx memristor
Pulse switching results of TaOx memristor with the verification process.
(a) A schematic of the incremental step pulse programming method used in this test, (b) The cycling result for 10k cycles with 2k and 10k ohm of target set and reset resistances, respectively. (c) The distributions of the switching voltages during this cycling.
