Figure 2 | Scientific Reports

Figure 2

From: Active layers of high-performance lead zirconate titanate at temperatures compatible with silicon nano- and microelectronic devices

Figure 2

Perovskite formation and crystallization kinetics of the PZT thin films.

The minimum annealing temperature required to obtain perovskite films with ferroelectric response from the Photosensitive (a,b) and Seeded Photosensitive (c–e) solution systems is shown (py = pyrochlore). Magnifications in the XRD patterns are provided for a better observation. (f) Avrami plots showing the evolution of the perovskite phase with annealing time are depicted for films crystallized at different temperatures from the Seeded Photosensitive solution and from conventional unseeded and seeded solutions. XRD patterns of the films prepared from the Photosensitive solution at 450 °C (g) and Seeded Photosensitive solution at 375 °C (h) for different annealing times.

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