Figure 2 | Scientific Reports

Figure 2

From: On the reliability of powder diffraction Line Profile Analysis of plastically deformed nanocrystalline systems

Figure 2

Instrumental Profile Function collected at the MCX beamline, Elettra-Sincrotrone Trieste using SRM 660a (LaB6): experimental pattern (circle), modelling (line) and residual (difference, line below), with a detail of a peak profile in the inset (a); parametrization of the IPF, with Full Width at Half Maximum (FWHM), integral breadth (β) and Lorentzian fraction of the pseudo-Voigt IPF line profile (η) as a function of the diffraction angle (b).

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