Table 1 Four probe resistance of the CVD graphene on various substrates.
From: Strong hole-doping and robust resistance-decrease in proton-irradiated graphene
substrate | Graphene | ||||
---|---|---|---|---|---|
sample number | type | Sid oping-level (Ω · cm) | Ri (kΩ) | Rf (kΩ) | ΔR/R (%) |
1 | ρSi = 10 | 1.71 | 0.66 | −61 | |
2 | SiO2/p-Si | ρSi = 10 | 1.11 | 0.34 | −69 |
3 | ρSi = 0.01 | 1.69 | 0.69 | −59 | |
4 | SiO2/n-Si | ρSi = 0.01 | 1.55 | 0.55 | −64.5 |
5 | Glass | — | 1280 | 1260 | −1.5 |
6 | Al2O3 | — | 470 | 400 | −15 |