Figure 1
From: Spatially resolved TiOx phases in switched RRAM devices using soft X-ray spectromicroscopy
Device architecture and electrical characterisation of solid-state RRAM devices.
(a) Schematic of the device stack structure. (b,c) Optical images of TiOx RRAM stand-alone devices. (d,e) Electrical characterization of devices before TXM measurement: (d) I-V curve of pristine device showing an initial high resistive state; (e) LRS state device (Inset: electroforming step).
